To analyze materials, fluids and gases SolMateS has an extensive set of characterization tools. These tools can be used to analyse and characterize the surface properties, optical properties, chemical structure, crystal structure and texture as well as physical properties. This equipment is placed in our own laboratory at different labs at the campus of the University of Twente and the Mesa+ Institute for Nanotechnology. Apart from these facilities we have partnerships to analyze fluids and the exact chemical composition of metals.
To measure the chemical composition and structure of bulk materials, powders and thin films several tools are typically used such as X-ray diffraction, X-ray Photo Spectroscopy (XPS) and SEM-EDX. With the latter two the presence of elements
and even the type of chemical bonds can be determined. Complementary XRF and ICP measurements can be carried out which are often used to determine the purity of metals. To determine the crystal structures and grain sizes for thin films, bulk materials and powders, X-ray Diffraction (XRD) is used. With an XRD-instrument properties such as the material composition, texture and phases can be identified. Furthermore it is suitable for stress measurements. Furthermore there is the ability to do Transmission Electron Microscopy (TEM). With this technique detailed interface studies can be carried out. All above research instruments can be used to determine the chemical composition and crystal structure at the micro and naoscale.Surface and composition analysis with SEM-EDX, AFM or XPS
To visualize surface morphology and composition different techniques such as Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and X-ray Photo
Spectroscopy can be used. With scanning probe techniques such as AFM, conductive AFM and STM extremely small structures up to the atomic limit can be visualized in a topography image. Furthermore average roughness values and peak to peak heights can be extracted. Besides the surface morphology is it possible to measure the chemical composition with SEM-EDX or XPS at a specific location. Several SEM's are often used with the best having a magnification of 200.000X.Optical analysis
To characterize the optical properties of an object or product the reflective and transmissive properties are typically measured. The transmission and reflection as a function of the wavelength can be measured of fluids, bulk materials and optical components. The complete spectrum from UV, visible and near infrared can be scanned. Besides this the film thickness and optical density can be determined.
Characterizing the physical properties of products and thin films
To characterize the physical properties of thin films a large range of test and measurement equipment can be used. With this equipment the electrical and magnetic behavior of products can be measured and quantified. To characterize materials and coatings the temperature dependent conductivity up to 4K and thermo-power can be measured with respectively a Probe station and a Seebeck Hot Stage. Besides this Hall measurements are possible to determine the type and density of charge carriers, as well as activation energies. This data is recorded with a Physical Properties Measurement System PPMS.
